Leica Microsystems’ optical profilometers for non-contact 3D mapping of sample surfaces with nanometre-level accuracy.
Designed to enhance sample handling efficiency, the Leica DCM8 combines the advantages of a confocal microscope with three lasers for generating high-resolution optical images with an interferometer within a single optical system. This makes it possible to significantly improve resolution along the Z-axis and achieve an accuracy of up to 0.1 nanometres.
