A transmission electron microscope is an instrument used to obtain images of the internal structure of materials with atomic resolution. A transmission electron microscope is used in situations where it is important to study the deep-seated properties of a sample, rather than just its surface.
TEM microscopy enables the investigation of nanostructures, defects and crystal lattices by using an electron beam to form an image.
A transmission electron microscope enables the study of the internal structure of samples by allowing electrons to pass through ultra-thin material. Unlike SEM, where the main focus is on surface morphology, a TEM reveals what lies hidden inside. As a result, this technology is in high demand in materials science, nanotechnology, solid-state physics and biomedicine.